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Thickness-dependent ferroelectric properties in fully-strained SrRuO3/BaTiO3/SrRuO3 ultra-thin capacitors

✍ Scribed by J.Y. Jo; Y.S. Kim; D.H. Kim; J.D. Kim; Y.J. Chang; J.H. Kong; Y.D. Park; T.K. Song; J.-G. Yoon; J.S. Jung; T.W. Noh

Book ID: 108287752
Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 294 KB
Volume: 486
Category: Article
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2004.11.225

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