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Interface structure and strain relaxation in BaTiO[sub 3] thin films grown on GdScO[sub 3] and DyScO[sub 3] substrates with buried coherent SrRuO[sub 3] layer

✍ Scribed by Chen, Y. B.; Sun, H. P.; Katz, M. B.; Pan, X. Q.; Choi, K. J.; Jang, H. W.; Eom, C. B.


Book ID
120045746
Publisher
American Institute of Physics
Year
2007
Tongue
English
Weight
655 KB
Volume
91
Category
Article
ISSN
0003-6951

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