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Thickness dependence of the magnetoelastic effect of CoFe2O4 films grown on piezoelectric substrates

✍ Scribed by Rus, S. F.; Herklotz, A.; Roth, R.; Schultz, L.; Dörr, K.

Book ID: 120632428
Publisher: American Institute of Physics
Year: 2013
Tongue: English
Weight: 908 KB
Volume: 114
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.4816686

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## Abstract CoFe~2~O~4~ films of 100 nm thickness were deposited on 20 nm, rf magnetron‐sputtered Fe~3~O~4~ underlayers on naturally oxidized Si (100) substrates. These films were then annealed, and the magnetic properties and microstructures were investigated as a function of annealing temperature