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Thickness dependence of the electronic properties in V[sub 2]O[sub 3] thin films

✍ Scribed by Grygiel, C.; Simon, Ch.; Mercey, B.; Prellier, W.; Frésard, R.; Limelette, P.

Book ID: 126268759
Publisher: American Institute of Physics
Year: 2007
Tongue: English
Weight: 413 KB
Volume: 91
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.2824465

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