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Thickness dependence of dielectric loss in SrTiO[sub 3] thin films

✍ Scribed by Li, Hong-Cheng; Si, Weidong; West, Alexander D.; Xi, X. X.

Book ID: 120311939
Publisher: American Institute of Physics
Year: 1998
Tongue: English
Weight: 371 KB
Volume: 73
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.121901

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