Thickness dependence of stress in La0.9Sr0.1MnO3 monocrystalline nanofilms using synchrotron radiation X-ray diffraction

✍ Scribed by Zhang, Hong-Di; Li, Zhao-Jian; Long, Yun-Ze; Xie, Hong-Wei; Sun, Bin; Lu, Hui-Bin; Mai, Zhen-Hong

• Book ID: 122106923
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 558 KB
• Volume: 366
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/j.jcrysgro.2012.12.025