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X-ray Multiple Diffraction in Renninger Scanning Mode: Simulation of Data Recorded using Synchrotron Radiation

✍ Scribed by Sasaki, J. M. ;Cardoso, L. P. ;Campos, C. ;Roberts, K. J. ;Clark, G. F. ;Pantos, E. ;Sacilotti, M. A.


Book ID
114501091
Publisher
International Union of Crystallography
Year
1996
Tongue
English
Weight
619 KB
Volume
29
Category
Article
ISSN
0021-8898

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