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Thickness dependence of dielectric breakdown voltage

โœ Scribed by Chang Lhymn; P.B. Kosel; R. Vaughan


Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
244 KB
Volume
145
Category
Article
ISSN
0040-6090

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๐Ÿ“œ SIMILAR VOLUMES


Thickness dependence of breakdown field
โœ V.K. Agarwal; V.K. Srivastava ๐Ÿ“‚ Article ๐Ÿ“… 1972 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 77 KB