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Thickness Dependence of Conductivity due to the Polycrystalline Structure in Evaporated CdS Thin Films

✍ Scribed by H. Berger; W. Kahle; G. Jäniche

Publisher: John Wiley and Sons
Year: 1968
Tongue: English
Weight: 232 KB
Volume: 28
Category: Article
ISSN: 0370-1972
DOI: 10.1002/pssb.19680280246

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