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Dependence of transport parameters on thickness in polycrystalline CdS thin films

✍ Scribed by E. Bertman; J.L. Morenza; J. Esteve

Publisher: Elsevier Science
Year: 1985
Tongue: English
Weight: 648 KB
Volume: 123
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(85)90004-5

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