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Thermographic nondestructive evaluation (NDE): an algorithm for automatic defect extraction in infrared images

✍ Scribed by Maldague, X.; Krapez, J.C.; Poussart, D.

Book ID: 114550794
Publisher: Institute of Electrical and Electronics Engineers
Year: 1990
Weight: 483 KB
Volume: 20
Category: Article
ISSN: 0018-9472
DOI: 10.1109/21.57287

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