Thermographic imaging and computer image processing of defects in building materials : Martin, J.W.; McKnight, M.E.; Bentz, D.P. An international Conference on Thermal Infrared Sensing for Diagnostics and Control (Thermosense VIII), Cambridge, Massachusetts (United States), 17–20 Sep. 1985, pp. 152–155. Proceedings of SPIE - The International Society for Optical Engineering, Vol. 581 (1986)

• Publisher: Elsevier Science
• Year: 1990
• Weight: 198 KB
• Volume: 23
• Category: Article
• ISSN: 0308-9126
• DOI: 10.1016/0308-9126(90)90238-j