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Thermoanalytic investigations of the semiconductor TlSbSe2

✍ Scribed by M. Salk; K. Wacker; J. Fischer; V. Krāmer

Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
439 KB
Volume
160
Category
Article
ISSN
0040-6031

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Relaxation spectrum of the TlSbSe2 thin
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The dielectric constant and the dielectric loss of TlSbSe 2 thin films, obtained via thermal evaporation of TlSbSe 2 crystals grown by Stockber-Bridgman technique, have been measured using ohmic Al electrodes in the frequency range 0.2-100 KHz and within the temperature interval 293-353 K. The capac