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Thermally Induced Switching and Failure in p-i-n RF Control Diodes

✍ Scribed by Chaffin, R.J.


Book ID
114658112
Publisher
IEEE
Year
1982
Tongue
English
Weight
450 KB
Volume
30
Category
Article
ISSN
0018-9480

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A no¨el switch topology is proposed in which p-i-n diodes are embedded in a transformer network free of ¨ia holes. The topology is designed to achie¨e cancellation of diode parasitics and optimization of insertion loss. Prototypes for 15 and 29.75 GHz operation showing ( ) ¨ery good insertion loss -