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Thermal Noise in MOSFETs: A Two- or a Three-Parameter Noise Model?

โœ Scribed by Emam, M.; Sakalas, P.; Vanhoenacker-Janvier, D.; Raskin, J.-P.; Tao Chuan Lim; Danneville, F.


Book ID
114619963
Publisher
IEEE
Year
2010
Tongue
English
Weight
349 KB
Volume
57
Category
Article
ISSN
0018-9383

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