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High-frequency thermal noise in MOSFETs

✍ Scribed by W.A. Baril; H.M. Choe; A. van der Ziel; S.T. Hsu


Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
236 KB
Volume
21
Category
Article
ISSN
0038-1101

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## Abstract A fringing field‐effect‐dependent MOSFET equivalent‐circuit model for its microwave frequency applications has been developed. The thermal noise performance of the device has also been analyzed, including the distributed gate. The equivalent‐current noise source takes into account the t