𝔖 Bobbio Scriptorium

✦ LIBER ✦

Thermal limitations of the thin film transistor : D. J. Page, Solid-St. Electron.11 (1968), p. 87

Publisher: Elsevier Science
Year: 1968
Tongue: English
Weight: 95 KB
Volume: 7
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(68)90099-1

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A simple non-destructive method of measu

A simple non-destructive method of measuring the thickness of transparent thin films between 10 and 600 nm : I. Franz and W. Langheinrich, Solid-St. Electron.11 (1968), p. 59

📂 Article 📅 1968 🏛 Elsevier Science 🌐 English ⚖ 95 KB