A simple non-destructive method of measuring the thickness of transparent thin films between 10 and 600 nm : I. Franz and W. Langheinrich, Solid-St. Electron.11 (1968), p. 59

• Publisher: Elsevier Science
• Year: 1968
• Tongue: English
• Weight: 95 KB
• Volume: 7
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(68)90100-5