Thermal expansion and effect of pressure on the electrical resistivity of a new dense Kondo compound CePtSi2
โ Scribed by G. Oomi; T. Kagayama; Y. Uwatoko
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 224 KB
- Volume
- 186-188
- Category
- Article
- ISSN
- 0921-4526
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โฆ Synopsis
The electrical resistivity p(T) of CePtSi 2 has been measured up to 20 kbar. It is found that two maxima exist in p(T) at ambient pressure but merge into a broad peak above 10 kbar. The thermal expansion coefficient a(T) is also measured at ambient pressure. A large enhancement in a/T is observed at low temperature.
๐ SIMILAR VOLUMES
Pressure effects on the electrical resistivity and thermoelectric power of La-Sr CuO-have been studied. The electrical resistivity decreases and thermoelectric power increases under pressure. The relative changes of these quantities are rather large in small x region and decreases with increasing