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Thermal diffusivity measurement of micron-thick semiconductor films by mirage detection

✍ Scribed by J.P. Roger; F. Lepoutre; D. Fournier; A.C. Boccara

Publisher: Elsevier Science
Year: 1987
Tongue: English
Weight: 495 KB
Volume: 155
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(87)90462-7

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