Thermal Conductivity Measurement of Low-kDielectric Films: Effect of Porosity and Density
β Scribed by Alam, M. T.; Pulavarthy, R. A.; Bielefeld, J.; King, S. W.; Haque, M. A.
- Book ID
- 121436036
- Publisher
- Springer US
- Year
- 2013
- Tongue
- English
- Weight
- 789 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0361-5235
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## Abstract Proposed highβpower electronic and optoelectronic applications of GaN materials rely heavily on the effectiveness of heat removal from the devices. Here we report the results of our measurements of thermal conductivity in the thick freeβstanding GaN films prepared by hydride vapor phase
The thermal conductivity of low-dielectric-constant (low-k) materials has been studied by a nano second thermoreflectance measurement system (Nano-TheMS). The Nano-TheMS, which utilizes thermoreflectance, can easily measure the thermal conductivity of thin film of nano-meter scale thickness. We have