๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Thermal Conductivity and Interface Thermal Conductance in Films of Tungsten–Tungsten Silicide on Si

โœ Scribed by Jagannadham, Kasichainula

Book ID
121862019
Publisher
IEEE
Year
2014
Tongue
English
Weight
695 KB
Volume
61
Category
Article
ISSN
0018-9383

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Thermal conductivity and interface therm
Thermal conductivity and interface thermal resistance of Si film on Si substrate determined by photothermal displacement interferometry
โœ B. S. W. Kuo; J. C. M. Li; A. W. Schmid ๐Ÿ“‚ Article ๐Ÿ“… 1992 ๐Ÿ› Springer ๐ŸŒ English โš– 860 KB

An in situ, noncontact, photothermal displacement interferometer for performing thermal diffusivity measurements on bulk and thin-fihn materials has been developed. Localized transient surface motion is generated through photothermoelastic coupling of a pulsed, heating laser beam to the sample under

Thermal and electrical conductivities of
Thermal and electrical conductivities of tungsten. Experimental results on single crystals compared with theory
โœ J. De Nobel ๐Ÿ“‚ Article ๐Ÿ“… 1957 ๐Ÿ› Elsevier Science โš– 430 KB

e m p e r a t u r e as a function of field s t r e n g t h a n e s t i m a t i o n of t h e lattice c o n d u c t i v i t y is made. Plots of w T (w = thermal resistance) v e r s u s T 3 gave s t r a i g h t lines for t h e lout crystals with deviations at low t e m p e r a t u r e (fig. ). The t e