Optimal burn-in decision making
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Taeho Kim; Way Kuo
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Article
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1998
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John Wiley and Sons
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English
β 97 KB
π 2 views
This paper presents a conceptual model of burn-in decision making which gives an optimal burn-in time for semiconductor devices and describes how burn-in affects total yield and reliability. For the gate oxide of integrated circuits we consider four burn-in policies: no burn-in, wafer-level burn-in