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Theory of hole mobility in strained Ge and III-V p-channel inversion layers with high-κ insulators

✍ Scribed by Zhang, Yan; Fischetti, M. V.; Sorée, B.; O’Regan, T.


Book ID
125429335
Publisher
American Institute of Physics
Year
2010
Tongue
English
Weight
404 KB
Volume
108
Category
Article
ISSN
0021-8979

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