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Theory and Experiments of the Impact of Work-Function Variability on Threshold Voltage Variability in MOS Devices

✍ Scribed by Zhang, Xiao; Mitard, Jerome; Ragnarsson, Lars-Ake; Hoffmann, Tomas; Deal, Michael; Grubbs, Melody E.; Li, Jing; Magyari-Kope, Blanka; Clemens, Bruce M.; Nishi, Yoshio

Book ID: 120077573
Publisher: IEEE
Year: 2012
Tongue: English
Weight: 305 KB
Volume: 59
Category: Article
ISSN: 0018-9383
DOI: 10.1109/TED.2012.2212021

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