NBTI related time-dependent variability of mobility and threshold voltage in pMOSFETs and their impact on circuit performance

✍ Scribed by N. Ayala; J. Martin-Martinez; E. Amat; M.B. Gonzalez; P. Verheyen; R. Rodriguez; M. Nafria; X. Aymerich; E. Simoen

• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 596 KB
• Volume: 88
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/j.mee.2011.03.093