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Theoretical investigation of surface roughness scattering in silicon nanowire transistors

✍ Scribed by Wang, Jing; Polizzi, Eric; Ghosh, Avik; Datta, Supriyo; Lundstrom, Mark


Book ID
121447230
Publisher
American Institute of Physics
Year
2005
Tongue
English
Weight
352 KB
Volume
87
Category
Article
ISSN
0003-6951

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