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Theoretical influence of surface states and bulk traps on thin film transistor characteristics

✍ Scribed by A. van Calster; H.J. Pauwels

Publisher: Elsevier Science
Year: 1975
Tongue: English
Weight: 681 KB
Volume: 18
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(75)90141-0

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