Theoretical analysis of free-ion yield in liquid argon under low-let irradiation

✍ Scribed by W.G. Burns; A. Mozumder

• Publisher: Elsevier Science
• Year: 1987
• Tongue: English
• Weight: 385 KB
• Volume: 142
• Category: Article
• ISSN: 0009-2614
• DOI: 10.1016/0009-2614(87)85127-8

✦ Synopsis

The relatively large probability ( ~0.35) of escaping electron-ion recombination in liquid argon, irradiated at low-LET in the presence of small collecting fields, is not consistent with Onsager's geminate model. A diffusion-kinetic model allowing electrostatic interaction, with a cylindrical initial Gaussian distribution of standard deviation z 3 pm can be made consistent with experimental results if a specific recombination rate %O.Ol times the Debye value is used. Other possibilities are discussed.