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Free-ion yield in liquid argon at low-LET

โœ Scribed by A. Mozumder

Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
482 KB
Volume
238
Category
Article
ISSN
0009-2614

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โœฆ Synopsis

A re-encounter model is proposed for electron-ion recombination on low-LET tracks in liquid argon. Consistency with measured escape probability for fields > 1 kV cm-' requires an encounter recombination probability = 0.01. The initial e-ion separation ( = 1500-1800 nm) is reconciled with thermalization by elastic collisions. Due to homogeneous recombination the experimental values fall below the calculated ones for fields less than = 1 kV cm-'.

๐Ÿ“œ SIMILAR VOLUMES

Theoretical analysis of free-ion yield i
Theoretical analysis of free-ion yield in liquid argon under low-let irradiation
โœ W.G. Burns; A. Mozumder ๐Ÿ“‚ Article ๐Ÿ“… 1987 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 385 KB

The relatively large probability ( ~0.35) of escaping electron-ion recombination in liquid argon, irradiated at low-LET in the presence of small collecting fields, is not consistent with Onsager's geminate model. A diffusion-kinetic model allowing electrostatic interaction, with a cylindrical initia