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Theoretical analysis of charge transfer loss arising from interface states in charge coupled devices

✍ Scribed by D.L. Heald

Book ID: 107856255
Publisher: Elsevier Science
Year: 1977
Tongue: English
Weight: 776 KB
Volume: 20
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(77)90040-5

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