## Abstract VโT measurements carried out on the ethyleneโnaphthalene system at constant composition are described. The measurements also provide data on the saturation volumes of solutions of naphthalene in supercritical ethylene.
The V-T-x space model of the ethylene-naphthalene system II
โ Scribed by G. S. A. van Welie; G. A. M. Diepen
- Book ID
- 104586345
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 192 KB
- Volume
- 80
- Category
- Article
- ISSN
- 0165-0513
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โฆ Synopsis
Abstract
Projections of the VโTโx space model of the ethyleneโnaphthalene system are derived from the observations recorded in the preceding publication ^1^ together with some supplementary measurements. The value for the critical volume at the second critical endpoint is found to be 77.0 ml/mol.
A number of Tโx and Vโx sections through the space model are derived from the same observations.
๐ SIMILAR VOLUMES
## Abstract An apparatus is described by means of which quantitative PโT measurements can be carried out visually, at constant composition, up to pressures of 1000 atmospheres. This apparatus is used for measuring the solubility of naphthalene in supercritical ethylene.
## Abstract In a Cailletet apparatus the solubility of naphthalene in supercritical ethylene has been determined quantitatively up to pressures of 200 atm, by visually measuring PโT sections at constant composition.
## Abstract Our two previous articles__G. S. A. van Welie__ and __G. A. M. Diepen__, Rec. trav. chim. **80**, 659 (1961). __Idem, ibid.__, **80**, 666 (1961). and some supplementary observations enabled us to derive a number of sections and projections of the PโTโx space model of the ethyleneโnap