## Abstract In a Cailletet apparatus the solubility of naphthalene in supercritical ethylene has been determined quantitatively up to pressures of 200 atm, by visually measuring P‐T sections at constant composition.
The P-T-x space model of the system ethylene-naphthalene (III)
✍ Scribed by G. S. A. van Welie; G. A. M. Diepen
- Book ID
- 104586342
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 244 KB
- Volume
- 80
- Category
- Article
- ISSN
- 0165-0513
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✦ Synopsis
Abstract
Our two previous articles__G. S. A. van Welie__ and G. A. M. Diepen, Rec. trav. chim. 80, 659 (1961).
Idem, ibid., 80, 666 (1961).
and some supplementary observations enabled us to derive a number of sections and projections of the P‐T‐x space model of the ethylene‐naphthalene system, within the following limits of measurement: 0 to 1000 atm, 0 to 100 moles % naphthalene and 20° to 115°. An important result of our discovery is that the critical conditions of the second critical point are: P = 174.0 atm, T = 52.1° and x = 17 moles % ± 0.5.
On the L~2~ = G curve we have found a pressure maximum at 244 atm and 195°.
📜 SIMILAR VOLUMES
## Abstract An apparatus is described by means of which quantitative P‐T measurements can be carried out visually, at constant composition, up to pressures of 1000 atmospheres. This apparatus is used for measuring the solubility of naphthalene in supercritical ethylene.
## Abstract V‐T measurements carried out on the ethylene‐naphthalene system at constant composition are described. The measurements also provide data on the saturation volumes of solutions of naphthalene in supercritical ethylene.
## Abstract Projections of the V‐T‐x space model of the ethylene‐naphthalene system are derived from the observations recorded in the preceding publication ^1^ together with some supplementary measurements. The value for the critical volume at the second critical endpoint is found to be 77.0 ml/mol