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The P-T-x space model of the system ethylene-naphthalene (III)

✍ Scribed by G. S. A. van Welie; G. A. M. Diepen


Book ID
104586342
Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
244 KB
Volume
80
Category
Article
ISSN
0165-0513

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✦ Synopsis


Abstract

Our two previous articles__G. S. A. van Welie__ and G. A. M. Diepen, Rec. trav. chim. 80, 659 (1961).

Idem, ibid., 80, 666 (1961).

and some supplementary observations enabled us to derive a number of sections and projections of the P‐T‐x space model of the ethylene‐naphthalene system, within the following limits of measurement: 0 to 1000 atm, 0 to 100 moles % naphthalene and 20° to 115°. An important result of our discovery is that the critical conditions of the second critical point are: P = 174.0 atm, T = 52.1° and x = 17 moles % ± 0.5.

On the L~2~ = G curve we have found a pressure maximum at 244 atm and 195°.


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