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The use of XPS, FTIR, SEM/EDX, contact angle, and AFM in the characterization of coatings

โœ Scribed by M. J. Walzak; R. Davidson; M. Biesinger


Book ID
111786621
Publisher
Springer US
Year
1998
Tongue
English
Weight
151 KB
Volume
7
Category
Article
ISSN
1059-9495

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