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The use of X-ray stress analysis for WC-base cermets

โœ Scribed by Aaron D. Krawitz

Publisher
Elsevier Science
Year
1985
Weight
671 KB
Volume
75
Category
Article
ISSN
0025-5416

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The use of x-ray diffraction under stres
The use of x-ray diffraction under stress for the study of the structure of amorphous polycarbonate
โœ I. Boukal ๐Ÿ“‚ Article ๐Ÿ“… 1970 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 365 KB

The influences of compression and tension on the diffraction angle 20 of the principal amorphous X-ray diffraction maximum of bisphenol A polycarbonate have been measured as well as the change of the lattice constant of crystalline polycarbonate under compressive stress. The values obtained have bee