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The use of standard deviation of X-ray diffraction lines as a measure of broadening in the Scherrer equation: a curve fitting method

✍ Scribed by McGehee, R. ;Renault, J.

Book ID: 114497956
Publisher: International Union of Crystallography
Year: 1972
Tongue: English
Weight: 786 KB
Volume: 5
Category: Article
ISSN: 0021-8898
DOI: 10.1107/s002188987200977x

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