The ups and downs of beam damage, contrast and noise in biological electron microscopy

✍ Scribed by E. Kellenberger

• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 1002 KB
• Volume: 17
• Category: Article
• ISSN: 0739-6260
• DOI: 10.1016/0739-6260(86)90041-9

✦ Synopsis

A personal account of the early problems associated with contrast in images obtained by electron microscopy from biological specimens is presented, together with the effects of electron beam damage. The author's experienceswith different types ofelectron microscope as well as problems of contrast enhancement is described. A short account is given of the physical effects occurring during specimen preparation and their relation to structural preservation when attempting to achieve atomic resolution. Recent developments in biological electron microscopy are also discussed with a view to future trends.