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The Ti/c-Si solid state reaction: II. Additional measurements by means of RBS, XPS and AES

✍ Scribed by J.M.M. De Nijs; A. Van Silfhout

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 884 KB
Volume: 40
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(90)90034-w

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