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The thickness dependence of the X-ray diffuse scattering intensity for crystals with microdefects at laue-case diffraction

✍ Scribed by Kochelab, V. V. ;Molodkin, V. B. ;Olikhovskii, S. I. ;Osinovskii, M. E.


Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
860 KB
Volume
108
Category
Article
ISSN
0031-8965

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