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Effect of twisting of the diffraction net planes on the integral intensities at Laue diffraction of X-rays in elastically bent silicon crystals

✍ Scribed by Datsenko, L. I. ;Kislovskii, E. N. ;Khrupa, V. I. ;Shevtsov-Kazmirchuk, K. M.


Publisher
John Wiley and Sons
Year
1983
Tongue
English
Weight
176 KB
Volume
78
Category
Article
ISSN
0031-8965

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