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The structure of nickel and indium oxide thin films from EXAFS data

✍ Scribed by V. Bets; T. Zamozdiks; A. Lusis; J. Purans; N. Bausk; M. Sheromov

Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
122 KB
Volume
261
Category
Article
ISSN
0168-9002

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EXAFS study of mixed nickel molybdenum o
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Mixed nickel molybdenum oxide thin films were produced by DC magnetron co-sputtering technique with the nickel content about 8, 16 and 25 at%. X-ray absorption spectroscopy at the Ni and Mo K-edges was used to study the local atomic structure in the films. The best-fit analysis of the EXAFS signals