EXAFS study of mixed nickel molybdenum oxide thin films at the Ni and Mo K-edges
✍ Scribed by J. Gaidelene; R. Kalendarev; A. Kuzmin; J. Purans
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 251 KB
- Volume
- 531
- Category
- Article
- ISSN
- 0168-9002
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✦ Synopsis
Mixed nickel molybdenum oxide thin films were produced by DC magnetron co-sputtering technique with the nickel content about 8, 16 and 25 at%. X-ray absorption spectroscopy at the Ni and Mo K-edges was used to study the local atomic structure in the films. The best-fit analysis of the EXAFS signals suggests that (i) the films are amorphous, except for the highest nickel content (25 at%), at which a segregation of NiO phase was observed; (ii) nickel and molybdenum atoms are octahedrally coordinated by oxygen atoms. Opposite to the NiO 6 octahedra, the MoO 6 octahedra are strongly distorted, that results in an existence of two groups of oxygen atoms-four nearest at B1.76 ( A and two distant at B2.2 ( A. It was also found that the MoO 6 octahedra are joined by edges, with the Mo-Mo distance about 3.26-3.31 ( A.