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The strain configuration within the facet of Czochralski grown indium antimonide

✍ Scribed by D.C. Miller


Book ID
103165417
Publisher
Elsevier Science
Year
1979
Tongue
English
Weight
534 KB
Volume
46
Category
Article
ISSN
0022-0248

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## Abstract Crack‐free GaN films have been achieved by inserting an In‐doped low‐temperature (LT) AlGaN interlayer grown on silicon by metalorganic chemical vapor deposition. The relationship between lattice constants __c__ and __a__ obtained by X‐ray diffraction analysis shows that indium doping i