✦ LIBER ✦
Electron-beam-induced strain within InGaN quantum wells: False indium “cluster” detection in the transmission electron microscope
✍ Scribed by Smeeton, T. M.; Kappers, M. J.; Barnard, J. S.; Vickers, M. E.; Humphreys, C. J.
- Book ID
- 111867142
- Publisher
- American Institute of Physics
- Year
- 2003
- Tongue
- English
- Weight
- 575 KB
- Volume
- 83
- Category
- Article
- ISSN
- 0003-6951
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