The statistics of dielectric breakdown in MOS capacitors under static and dynamic voltage stress

✍ Scribed by S.K. Haywood; M.M. Heyns; R.F. De Keersmaecker

• Book ID: 107925612
• Publisher: Elsevier Science
• Year: 1987
• Tongue: English
• Weight: 490 KB
• Volume: 30
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/0169-4332(87)90109-7