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The segregation of bismuth to grain boundaries in copper-bismuth alloys

✍ Scribed by B.D Powell; H Mykura


Publisher
Elsevier Science
Year
1973
Weight
824 KB
Volume
21
Category
Article
ISSN
0001-6160

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The distribution of segregation levels of bismuth to grain boundaries in copper has been measured and compared using Auger electron spectroscopy (AES) and X-ray energy-dispersive spectroscopy (XEDS) in a scanning transmission electron microscope (STEM). The STEM-XEDS measurements showed that there a