Variability in the segregation of bismut
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V.J. Keast; A. La Fontaine; J. du Plessis
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Article
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2007
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Elsevier Science
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English
⚖ 235 KB
The distribution of segregation levels of bismuth to grain boundaries in copper has been measured and compared using Auger electron spectroscopy (AES) and X-ray energy-dispersive spectroscopy (XEDS) in a scanning transmission electron microscope (STEM). The STEM-XEDS measurements showed that there a