e-Induced secondary electron emission yi
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J. Cazaux
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Article
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2006
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Elsevier Science
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English
โ 548 KB
Based on a more realistic description of the in-depth secondary electron generation than that of standard (constant loss) model, a new model for the e-induced secondary electron emission yield, d = f(E 0 ), is applied to account for the observed mean atomic number dependence of the reduced yield cur