Defect states in Czochalski p-type silic
โ
Castaldini, A. ;Cavalcoli, D. ;Cavallini, A. ;Pizzini, S.
๐
Article
๐
2005
๐
John Wiley and Sons
๐
English
โ 190 KB
## Abstract This contribution reports the study, by junction spectroscopies, of electronic states induced by thermal and deformation treatments in pโtype Si. In order to understand the role that oxygen precipitation, metallic contamination and plastic deformation play on the defect states, several