The role of defects in current transport through tetrahedral amorphous carbon-based metal–semiconductor–metal structures

✍ Scribed by Y.H. Hu; X. Shi; E. Liu; J.R. Shi; L.K. Cheah

• Book ID: 117150098
• Publisher: Elsevier Science
• Year: 1999
• Tongue: English
• Weight: 234 KB
• Volume: 260
• Category: Article
• ISSN: 0022-3093
• DOI: 10.1016/s0022-3093(99)00560-8